Investigation of wurtzite (B,Al)N films prepared on polycrystalline diamond

J. H. Song, J. L. Huang, H. H. Lu, J. C. Sung

研究成果: Article

14 引文 斯高帕斯(Scopus)

摘要

The growth of epitaxial GaN on polycrystalline diamond using highly c-axis orientated AlN as a buffer layer is an attractive application for heat dissipation of LED devices. In this study, the (B,Al)N layer was used to bridge the gap of lattice mismatch between diamond and AlN. For the preparation of (B,Al)N films on a diamond substrate, an aluminum target was sputtered in DC mode and hBN in RF mode simultaneously in a pure nitrogen plasma. The results showed boron content in (B,Al)N film which were determined by X-ray photoelectron spectroscopy (XPS) increased with increase of RF sputtering power. The lattice constant of (B,Al)N films were smaller than pure AlN, suggesting the substitution of smaller boron atoms at Al positions. As the boron content increased, the crystallinity of (B,Al)N films decreased. The crystal qualities of AlN films was analyzed by rocking curve, and AlN was deposited on low boron content (B,Al)N layer with higher c-axis preferential orientation than if it had been grown on diamond directly.

原文English
頁(從 - 到)223-227
頁數5
期刊Thin Solid Films
516
發行號2-4
DOIs
出版狀態Published - 2007 十二月 3

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

指紋 深入研究「Investigation of wurtzite (B,Al)N films prepared on polycrystalline diamond」主題。共同形成了獨特的指紋。

  • 引用此