摘要
GaN epitaxial layers and InGaN/GaN multiquantum well blue light emitting diodes (LEDs) were prepared on both patterned sapphire substrates (PSS) and conventional sapphire substrates. From scanning electron microscopy micrographs of GaN epitaxial layers on PSS, it was found that lateral growth indeed occurred and the lateral to vertical growth rate ratio was around 2. It was also found that we could enhance the LED output power by using lateral epitaxial patterned sapphire. Such an enhancement could be attributed to the reduced dislocation density in the lateral growth regions of the epitaxial layers.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 466-470 |
| 頁數 | 5 |
| 期刊 | Journal of Crystal Growth |
| 卷 | 261 |
| 發行號 | 4 |
| DOIs | |
| 出版狀態 | Published - 2004 2月 1 |
All Science Journal Classification (ASJC) codes
- 凝聚態物理學
- 無機化學
- 材料化學
指紋
深入研究「Lateral epitaxial patterned sapphire InGaN/GaN MQW LEDs」主題。共同形成了獨特的指紋。引用此
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