Low-Power Testing for C-testable Iterative Logic Arrays

S.-A. Hwang, Cheng-Wen Wu

研究成果: Conference contribution

原文English
主出版物標題IEEE International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)
出版地Taipei
頁面355-358
出版狀態Published - 1997 六月

引用此

Hwang, S-A., & Wu, C-W. (1997). Low-Power Testing for C-testable Iterative Logic Arrays. 於 IEEE International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) (頁 355-358).