TY - JOUR
T1 - Low test-application time method for EEPLA testing
AU - Wei, K. C.
AU - Liu, B. D.
AU - Tang, J. J.
PY - 1997/1/1
Y1 - 1997/1/1
N2 - An efficient method for EEPLA testing is presented. In this method the authors propose an interleave programming algorithm for the EEPLA to enhance the controllability of the OR plane and the observability of the AND plane during the testing of EEPLA. The salient features of this method are: (i) low overhead, (ii) high fault coverage, (iii) simple test set, and (iv) low test-application time. Using this method, all multiple stuck-at faults, multiple crosspoint faults and all multiple bridging faults can be detected.
AB - An efficient method for EEPLA testing is presented. In this method the authors propose an interleave programming algorithm for the EEPLA to enhance the controllability of the OR plane and the observability of the AND plane during the testing of EEPLA. The salient features of this method are: (i) low overhead, (ii) high fault coverage, (iii) simple test set, and (iv) low test-application time. Using this method, all multiple stuck-at faults, multiple crosspoint faults and all multiple bridging faults can be detected.
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U2 - 10.1049/ip-cdt:19970636
DO - 10.1049/ip-cdt:19970636
M3 - Article
AN - SCOPUS:0030682268
SN - 1350-2387
VL - 144
SP - 39
EP - 42
JO - IEE Proceedings: Computers and Digital Techniques
JF - IEE Proceedings: Computers and Digital Techniques
IS - 1
ER -