Measuring long-range carrier diffusion across multiple grains in polycrystalline semiconductors by photoluminescence imaging

Keyphrases

• Carrier Diffusion 100%
• CdTe Thin Films 50%
• Cellular Circuits 50%
• Electronic Defects 50%
• Large-area Solar Cells 50%
• Localized Defect States 50%
• Low Temperature Diffusion 50%
• Multiple Grains 100%
• Photoluminescence Imaging 100%
• Polycrystalline CdTe 100%
• Polycrystalline Semiconductor 100%
• Selectional Restrictions 50%
• Substrate Selection 50%
• Willingness to Act 50%

Material Science

• Carrier Transport 100%
• Electronic Circuit 50%
• Grain Boundary 50%
• Photoluminescence 100%
• Solar Cell 50%
• Thin Films 100%

Engineering

• Cdte Thin 25%
• Integrated Circuit 25%
• Low-Temperature 50%
• Optoelectronics 25%
• Polycrystalline 100%
• Solar Cell 25%
• Thin Films 50%