Microscopic surface characterization of polyaniline-based conducting elastomers

The surface morphology and interpenetrated network (IPN) structure of polyaniline-based conductive elastomer were studied by both scanning electron microscopy (SEM) and electron probe X-ray microanalyzer (EPMA) techniques. Using the thinly sliced cross-section of a conductive elastomer film, we observed a relatively homogeneous, bright layer of polyaniline along the surface of film showing a sharp edge at the interface with the bulk polymer matrix, as examined by the SEM micrograph. The X-ray mapping of chlorine content on the same film indicated an even distribution of polyaniline rods around a thin layer region of 20 μm from the surface of matrix in the EPMA micrograph.