Microwave-frequency loss and dispersion in ferroelectric Ba 0.3Sr 0.7 TiO 3 thin films

James C. Booth, Ichiro Takeuchi, Kao Shuo Chang

研究成果: Article同行評審

28 引文 斯高帕斯(Scopus)

摘要

We report on broadband microwave-frequency measurements of epitaxial ferroelectric Ba0.3 Sr0.7 TiO3 thin films that reveal systematic increases in the loss and dispersion as the frequency increases toward 40 GHz. Our analysis provides evidence that the origin of this increased loss and dispersion is the direct coupling of microwave energy into a broad distribution of damped soft-phonon modes. We believe that nanometer-sized polar regions in the thin films play a role in this process, resulting in lattice-dynamical loss mechanisms that extend several decades in frequency below the frequency of the soft mode in these thin-film materials.

原文English
文章編號082908
期刊Applied Physics Letters
87
發行號8
DOIs
出版狀態Published - 2005 八月 22

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

指紋 深入研究「Microwave-frequency loss and dispersion in ferroelectric Ba <sub>0.3</sub>Sr <sub>0.7</sub> TiO <sub>3</sub> thin films」主題。共同形成了獨特的指紋。

引用此