Switched capacitors are commonly used in analog circuits to increase the accuracy of analog signal processing and lower power consumption. To take full advantage of switched capacitors, it is very important to achieve accurate capacitance ratios in the layout of the capacitor arrays, which are affected by systematic and random mismatches. A good capacitor placement should have a common-centroid structure with the highest possible degree of dispersion to mitigate mismatches. Several dummy units should be inserted to make the placement shape more square and compact. This paper proposes a simulated-annealing-based approach for mismatch-aware common-centroid placement under the above constraints. A pair-sequence representation is used to record a placement, and a couple of associated operations are developed to find better solutions. The experimental results show that the proposed placements achieve smaller oxide-gradient-induced mismatch and larger overall correlation coefficients (i.e., higher degree of dispersion) than those of previous works.
|頁（從 - 到）||1789-1802|
|期刊||IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|
|出版狀態||Published - 2012|
All Science Journal Classification (ASJC) codes