MULTI-ELECTRODE CONDUCTIVE PROBE, MANUFACTURING METHOD OF INSULATING TRENCHES AND MEASUREMENT METHOD USING MULTI-ELECTRODE CONDUCTIVE PROBE

貢獻的翻譯標題: 多極導電探針、絕緣溝槽製造方法及使用多極導電探針的量測方法

Hao-Chih Liu (Inventor)

研究成果: Patent

摘要

A multi-electrode conductive probe, a manufacturing method of insulating trenches and a measurement method using the multi-electrode conductive probe are disclosed. The conductive probe includes a base, a plurality of support elements, a plurality of tips and a conductive layer. The base has a surface and a plurality of protrusions. The protrusions are configured on the surface in a spacing manner, and an insulating trench is disposed between the two adjacent protrusions. The support elements are disposed at the base and protrude from the base. The tips are disposed on the end of the support elements away from the base. The conductive layer covers the surface of the base, the protrusions, the support elements and the tips. Portions of the conductive layer on the two adjacent support elements are electrically insulated from each other by at least an insulating trench.
貢獻的翻譯標題多極導電探針、絕緣溝槽製造方法及使用多極導電探針的量測方法
原文English
專利號9739802
出版狀態Published - 2015 七月 9

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