Multi-layer Permittivity Measurement Based on Complementary Split-Ring Resonator and Neural Networks

Chung En Yu, Chin Lung Yang

研究成果: Conference contribution

摘要

A neural network-based method for multi-layer permittivity measurement is proposed in this paper. This method uses the multiple-square concentric complementary split-ring resonator (CSRR) to take multiple non-identical resonance frequency measurement, and a scalable, iterative neural network approach is applied to estimate for dielectric property measurement. Instead of the tedious development and establishment of analytic formulas, neural network engine solver can simplify this step and still have acceptable accuracy. The dual-layer MUTs measurement had an average error of 8.78% for ?1 and an average error of 8.9% for ?2. It can be extended to the measurement of more than two layers substrate.

原文English
主出版物標題Proceedings - 2020 International Workshop on Electromagnetics
主出版物子標題Applications and Student Innovation Competition, iWEM 2020
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781728199894
DOIs
出版狀態Published - 2020 八月 26
事件2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2020 - Penghu, Taiwan
持續時間: 2020 八月 262020 八月 28

出版系列

名字Proceedings - 2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2020

Conference

Conference2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2020
國家Taiwan
城市Penghu
期間20-08-2620-08-28

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Instrumentation

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