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Multi-Project System-on-Chip (MP-SoC): A novel test vehicle for SoC silicon prototyping

  • Chun Ming Huang
  • , Kuen Jong Lee
  • , Chih Chyau Yang
  • , Wen Hsiang Hu
  • , Shi Shen Wang
  • , Jeng Bin Chen
  • , Chi Shi Chen
  • , Lan Da Van
  • , Chien Ming Wu
  • , Wei Chang Tsai
  • , Jing Yang Jou

研究成果: Conference contribution

13   連結會在新分頁中開啟 引文 斯高帕斯(Scopus)

摘要

In this paper, we propose a novel SoC design methodology referred to as Multi-Project System-on-a-Chip (MP-SoC), which can integrate multiple heterogeneous SoC design projects into a single chip such that the total silicon prototyping cost for these projects can be greatly reduced due to the sharing of a common SoC platform. The design flows for the system architecture, individual IP blocks, as well as the logic and physical implementations of MP-SoC are explored. The isolation mechanism to prevent interference among the IPs and the arbitration mechanism to grant the bus usage for master IPs are also presented. A test chip named MP-SoC-I that includes 8 SoC projects from 4 universities was selected as a demonstration example for verifying the MP-SoC design concept. This chip is designed and implemented in TSMC 0.13μm CMOS generic logic process technology, and the total silicon area for MP-SoC-I test chip is 4950μm×4938μm. Experimental results of MP-SoC-I test chip show that all projects are successfully implemented in the common platform and 82.91% silicon area is saved with this MP-SoC methodology as compared with the case where multiple SoC projects are fabricated individually.

原文English
主出版物標題2006 IEEE International Systems-on-Chip Conference, SOC
發行者Institute of Electrical and Electronics Engineers Inc.
頁面137-140
頁數4
ISBN(列印)0780397819, 9780780397811
DOIs
出版狀態Published - 2006 1月 1
事件2006 IEEE International Systems-on-Chip Conference, SOC - Austin, TX, United States
持續時間: 2006 9月 242006 9月 27

出版系列

名字2006 IEEE International Systems-on-Chip Conference, SOC

Other

Other2006 IEEE International Systems-on-Chip Conference, SOC
國家/地區United States
城市Austin, TX
期間06-09-2406-09-27

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

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