Multifinger embedded T-shaped gate graphene RF transistors with high ratio

Shu Jen Han, Satoshi Oida, Keith A. Jenkins, Darsen Lu, Yu Zhu

研究成果: Article同行評審

20 引文 斯高帕斯(Scopus)

摘要

Gate resistance plays a key role in determining the maximum oscillation frequency fMAXof all radio frequency transistors. This letter presents a new graphene device structure having multiple-finger T-shaped gates embedded in the substrate. The structure possesses several advantages over conventional top gate structures, including low gate resistance, low parasitic capacitance, scalable gate dielectric, and simple interconnect wiring. With 1 V drain bias, fMAX up to 20 GHz, and sim 25\%$-43% higher than the current gain cutoff frequency fT, is achieved from devices with a channel length down to 250 nm.

原文English
文章編號6578134
頁(從 - 到)1340-1342
頁數3
期刊IEEE Electron Device Letters
34
發行號10
DOIs
出版狀態Published - 2013

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 電氣與電子工程

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