TY - JOUR
T1 - Multifinger embedded T-shaped gate graphene RF transistors with high ratio
AU - Han, Shu Jen
AU - Oida, Satoshi
AU - Jenkins, Keith A.
AU - Lu, Darsen
AU - Zhu, Yu
PY - 2013
Y1 - 2013
N2 - Gate resistance plays a key role in determining the maximum oscillation frequency fMAXof all radio frequency transistors. This letter presents a new graphene device structure having multiple-finger T-shaped gates embedded in the substrate. The structure possesses several advantages over conventional top gate structures, including low gate resistance, low parasitic capacitance, scalable gate dielectric, and simple interconnect wiring. With 1 V drain bias, fMAX up to 20 GHz, and sim 25\%$-43% higher than the current gain cutoff frequency fT, is achieved from devices with a channel length down to 250 nm.
AB - Gate resistance plays a key role in determining the maximum oscillation frequency fMAXof all radio frequency transistors. This letter presents a new graphene device structure having multiple-finger T-shaped gates embedded in the substrate. The structure possesses several advantages over conventional top gate structures, including low gate resistance, low parasitic capacitance, scalable gate dielectric, and simple interconnect wiring. With 1 V drain bias, fMAX up to 20 GHz, and sim 25\%$-43% higher than the current gain cutoff frequency fT, is achieved from devices with a channel length down to 250 nm.
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U2 - 10.1109/LED.2013.2276038
DO - 10.1109/LED.2013.2276038
M3 - Article
AN - SCOPUS:84884817962
SN - 0741-3106
VL - 34
SP - 1340
EP - 1342
JO - IEEE Electron Device Letters
JF - IEEE Electron Device Letters
IS - 10
M1 - 6578134
ER -