摘要
High-quality InGaN-GaN multiquantum well (MQW) light-emitting diode (LED) structures were prepared by temperature ramping method during metalorganic chemical vapor deposition (MOCVD) growth. It was found that we could reduce the 20-mA forward voltage and increase the output intensity of the nitride-based green LEDs by increasing the growth temperature of GaN barrier layers from 700 °C to 950 °C. The 20-mA output power and maximum output power of the nitride-based green LEDs with high temperature GaN barrier layers was found to be 2.2 and 8.9 mW, respectively, which were more than 65% larger than those observed from conventional InGaN-GaN green LEDs. Such an observation could be attributed to the improved crystal quality of GaN barrier layers. The reliability of these LEDs was also found to be reasonably good.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 1766-1770 |
| 頁數 | 5 |
| 期刊 | IEEE Transactions on Electron Devices |
| 卷 | 50 |
| 發行號 | 8 |
| DOIs | |
| 出版狀態 | Published - 2003 8月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 電氣與電子工程
指紋
深入研究「Nitride-based green light-emitting diodes with high temperature GaN barrier layers」主題。共同形成了獨特的指紋。引用此
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