Noise properties of ZnO nanowalls deposited using rapid thermal evaporation technology

T. P. Chen, F. Y. Hung, S. P. Chang, S. J. Chang, S. L. Wu, Z. S. Hu

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

ZnO nanowalls are rapidly grown on a glass substrate using a low-temperature thermal evaporation method, without the use of a catalyst and the pre-deposition of a ZnO seed layer on the substrate. Most of the ZnO nanowalls are grown vertically and are about 70-200-nm thick and 2-μm long. The room-temperature photoluminescence spectra show a strong intrinsic ultraviolet (UV) emission and a weak defectrelated orange emission. The ZnO nanowall UV sensor is highly sensitive to UV light, with an excellent UV-to-visible ratio and good flicker noise characteristics. This shows the strong potential of ZnO nanowalls for use in UV sensors. At an applied bias of 2 V, the noise equivalent power and the normalized detectivity of the ZnO nanowall UV sensor are 1.87 × 10-10 W and 3.38 × 10 9 cm·Hz0.5·W-1, respectively..

原文English
文章編號6384664
頁(從 - 到)213-216
頁數4
期刊IEEE Photonics Technology Letters
25
發行號3
DOIs
出版狀態Published - 2013

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 原子與分子物理與光學
  • 電氣與電子工程

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