Noncontact measurement of complex permittivity and thickness by using planar resonators

Chin Lung Yang, Chieh Sen Lee, Kuan Wei Chen, Kuan Zhou Chen

研究成果: Article同行評審

172 引文 斯高帕斯(Scopus)

摘要

This paper presents a novel noncontact measurement technique that entails using a single-compound triple complementary split-ring resonator (SC-TCSRR) to determine the complex permittivity and thickness of a material under test (MUT). The proposed technique overcomes the problem engendered by the existence of air gaps between the sensor ground plane and the MUT. In the proposed approach, a derived governing equation of the resonance frequencies is used to estimate the thickness and complex permittivity of the MUT by calculating the resonant frequency (fr) and magnitude response in a single-step noncontact measurement process. This study theoretically analyzed and experimentally verified a simple and low-cost SC-TCSRR measurement method for assessing materials in a noncontact method. For a 0.2-mm air gap, the experiments yielded average measurement errors of 4.32% and 5.05% for the thickness and permittivity, respectively. The proposed SC-TCSRR technique provides excellent solutions for reducing the effect of air-gap conditions on permittivity, thickness, and loss tangent in noncontact measurements.

原文English
文章編號7358167
頁(從 - 到)247-257
頁數11
期刊IEEE Transactions on Microwave Theory and Techniques
64
發行號1
DOIs
出版狀態Published - 2016 1月 1

All Science Journal Classification (ASJC) codes

  • 輻射
  • 凝聚態物理學
  • 電氣與電子工程

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