Nondestructive investigation of microstructures and defects at a SrTiO3 bicrystal boundary

Q. D. Jiang, Z. J. Huang, A. Brazdeikis, M. Dezaneti, C. L. Chen, P. Jin, C. W. Chu

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8 引文 斯高帕斯(Scopus)

摘要

The effects of thermal annealing on the microstructure at the grain boundary of a 36.8° symmetric [100] tilt SrTiO3 bicrystal were studied. Scanning tunneling microscopy and atomic force microscopy were used for nondestructive observation of the boundary structures. Annealing the bicrystalline substrates at temperatures as low as 780°C led to the formation of grooves at their boundaries. This provides direct evidence that the thickness depression of YBa2Cu3O7-δ films at the bicrystal boundaries originates from the underlying grooved substrates. Defects characterized as holes with diameters ranging from ∼30nm to ∼200nm were also observed.

原文English
頁(從 - 到)3365-3367
頁數3
期刊Applied Physics Letters
72
發行號25
DOIs
出版狀態Published - 1998

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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