Normal incidence detector using Ge quantum well structures grown on Si (100)

Chanho Lee, S. K. Chun, K. L. Wang

研究成果: Conference article同行評審

原文English
文章編號1009622
期刊Device Research Conference - Conference Digest, DRC
Part F146191
DOIs
出版狀態Published - 1993
事件51st Annual Device Research Conference, DRC 1993 - Santa Barbara, United States
持續時間: 1993 六月 211993 六月 23

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

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