Off-plane diffraction of extreme ultraviolet light caused by line width roughness

Wen Yu Chen, Chun Hung Lin

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Off-plane diffraction of extreme ultraviolet light caused by line width roughness」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds