TY - GEN
T1 - On evaluating the measurement capability of high-quality processes
AU - Lyu, J. J.
AU - Chen, M. N.
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Measurement systems analysis (MSA) ensures that the required data can reliably perform quality improvement initiatives. The common program to assess the precision of a measurement system is the gauge repeatability and reproducibility(R&R) study. Few investigations relate to the gauge R&R study for attribute data despite a need for industrial applications. Industries with near zero-defect manufacturing environments often experience occasional nonconformities in some samples when random shocks arise. The standard MSA may fail to identify defective data from high-quality processes. This study proposes an attribute gauge system to enhance the capability of the measurement system. The process and potential of the proposed system is illustrated using a manufacturing case.
AB - Measurement systems analysis (MSA) ensures that the required data can reliably perform quality improvement initiatives. The common program to assess the precision of a measurement system is the gauge repeatability and reproducibility(R&R) study. Few investigations relate to the gauge R&R study for attribute data despite a need for industrial applications. Industries with near zero-defect manufacturing environments often experience occasional nonconformities in some samples when random shocks arise. The standard MSA may fail to identify defective data from high-quality processes. This study proposes an attribute gauge system to enhance the capability of the measurement system. The process and potential of the proposed system is illustrated using a manufacturing case.
UR - http://www.scopus.com/inward/record.url?scp=62749201529&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=62749201529&partnerID=8YFLogxK
U2 - 10.1109/IEEM.2008.4738231
DO - 10.1109/IEEM.2008.4738231
M3 - Conference contribution
AN - SCOPUS:62749201529
SN - 9781424426300
T3 - 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
SP - 2046
EP - 2050
BT - 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
T2 - 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
Y2 - 8 December 2008 through 11 December 2008
ER -