On test and diagnostics of flash memories

Chih Tsun Huang, Jen Chieh Yeh, Yuan Yuan Shih, Rei Fu Huang, Cheng Wen Wu

研究成果: Conference article同行評審

4 引文 斯高帕斯(Scopus)

摘要

Embedded flash memory has been widely used in applications that require non-volatile on-chip storage elements. However, test and diagnostics of flash memories needs further investigation so that the overall cost of the products can be reduced. This paper presents the challenges and issues for test and diagnostics of flash memories, based on our recent experiences. We also suggest improvement of the test and diagnosis flow, including design-for-testability (DFT) using built-in self-test (BIST), built-in self-repair (BISR), and failure analysis. In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips justify the effectiveness of our test and diagnostics system.

原文English
頁(從 - 到)260-265
頁數6
期刊Proceedings of the Asian Test Symposium
出版狀態Published - 2004 十二月 1
事件Proceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
持續時間: 2004 十一月 152004 十一月 17

All Science Journal Classification (ASJC) codes

  • 媒體技術
  • 硬體和架構

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