On the charge sharing problem in CMOS stuck-open fault testing

Kuen-Jong Lee, Melvin A. Breuer

研究成果: Conference contribution

16 引文 斯高帕斯(Scopus)

摘要

The charge-sharing problem associated with the detection of CMOS stuck-open faults is analyzed. It is shown that this problem cannot be ignored if high-quality tests are required, and that assuming the worst-case condition and using conventional testing techniques may dramatically reduce the detectability of stuck-open faults. The authors present a layout-driven method to characterize this problem and show that by a monitoring of the current supply this problem becomes much easier to solve. Through the use of current supply monitoring a very high improvement factor, which can easily offset the error caused by imprecise estimations of capacitance, has been obtained. It is demonstrated that by slight modification of the layout of a circuit the charge-sharing problem can be eliminated. A robust test generation procedure is also presented.

原文English
主出版物標題Digest of Papers - International Test Conference
發行者Publ by IEEE
頁面417-426
頁數10
ISBN(列印)0818620641
出版狀態Published - 1990 九月 1
事件Proceedings - International Test Conference 1990 - Washington, DC, USA
持續時間: 1990 九月 101990 九月 14

出版系列

名字Digest of Papers - International Test Conference
ISSN(列印)0743-1686

Other

OtherProceedings - International Test Conference 1990
城市Washington, DC, USA
期間90-09-1090-09-14

All Science Journal Classification (ASJC) codes

  • 工程 (全部)

指紋

深入研究「On the charge sharing problem in CMOS stuck-open fault testing」主題。共同形成了獨特的指紋。

引用此