A new method using a monochromatic light-emitting diode (LED) to measure the optical density (OD) of the black matrix of thin-film transistor liquid crystal display (LCD) is developed in this study. The measured results show that the average OD difference is within 1% between the proposed 3W monochromatic LED and the currently adopted 100Wquartz halogen lamp. On the other hand, the monochromatic LED reduces the boosting time by 40% in establishing the baseline database. The 3σ standard deviation of the OD of the test samples is from 0.1% to 0.6% for the LED, whereas it is from 0.5% to 1.2% for the halogen lamp. Using standard glass samples, the monochromatic LED demonstrates accuracy within 1.58%, better than that of the quartz halogen lamp. Therefore, it can substitute for the quartz halogen lamp currently used in the thin-film transistor LCD industry for OD measurement of the black matrix layer, as it is faster, is more accurate, is more reliable, and consumes less power.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering