Optical reflection spectroscopy for characterizing defects in high-quality CVD graphene on copper

Cheng Lung Chung, Pinyi Li, Chih Chun Chang, Yuchun Chen, Dong Ming Wu, Yonhua Tzeng

研究成果: Conference contribution

摘要

Graphene is known to be an excellent diffusion barrier for practically all gas atoms and molecules including oxygen. Therefore, a defect free graphene grown on copper prevents the oxidation of copper in air even for months. On the other hand, some defects in CVD graphene allow oxygen to penetrate and oxidize copper beneath the graphene. Copper oxide thus formed reduces the reflectivity of visible light especially in the short wavelength range and tarnishes the graphene covered copper. The wavelength dependent reduction on light reflectivity is sensitive to the types, density, and distribution of defects in CVD graphene. In comparison, micro-Raman spectroscopy usually measures Raman scattering at small spots of laser illumination. As long as the laser illuminated area is defect free, the presence of defects in other parts of the graphene is not detected. Since these defects affect adversely the overall electronic properties, an effective and simple means of detecting defects and domain boundaries is desirable. Instead of expensive fabrication of devices for measuring the electron mobility and the Raman scattering characterization, we demonstrate a simple and effective means based on optical refection spectroscopy to effectively differentiate high quality graphene from poor quality graphene by measuring the wavelength dependent reflectivity of graphene on copper at the ambient temperature or at an elevated temperature to accelerate the penetration of oxygen through defects for the oxidation of copper heating the graphene.

原文English
主出版物標題IEEE-NANO 2015 - 15th International Conference on Nanotechnology
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1258-1261
頁數4
ISBN(電子)9781467381550
DOIs
出版狀態Published - 2015 一月 1
事件15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy
持續時間: 2015 七月 272015 七月 30

出版系列

名字IEEE-NANO 2015 - 15th International Conference on Nanotechnology

Other

Other15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
國家Italy
城市Rome
期間15-07-2715-07-30

All Science Journal Classification (ASJC) codes

  • Process Chemistry and Technology
  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films

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