TY - JOUR
T1 - Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators
AU - Hsu, Shu Han
AU - Huang, Ying Yuan
AU - Wu, Yi Da
AU - Yang, Kexin
AU - Lin, Li Hsiang
AU - Milor, Linda
N1 - Publisher Copyright:
© 2020 Elsevier Ltd
PY - 2020/11
Y1 - 2020/11
N2 - The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.
AB - The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.
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U2 - 10.1016/j.microrel.2020.113753
DO - 10.1016/j.microrel.2020.113753
M3 - Article
AN - SCOPUS:85096364035
SN - 0026-2714
VL - 114
JO - Microelectronics Reliability
JF - Microelectronics Reliability
M1 - 113753
ER -