Oscillation-test technique for buck voltage regulator

Jing Yi Huang, Chun Hsun Wu, Le Ren Chang-Chien, Soon Jyh Chang

研究成果: Conference contribution

摘要

In this paper, a vector-less simple technique based on the oscillation-test strategy (OTS) is proposed for the test of the Buck regulator. In the test mode, the circuit under test (CUT) of the buck regulator could be easily transformed into an oscillator for generating the oscillating signal. By observing the frequency and amplitude of the oscillating signal, we could detect the CUT to see if it is faulty or fault-free. Simulation results show that the fault coverage for hard faults could reach up to 99%. Based on the facts of the simple structure and high fault coverage, OTS is considered as a useful technique in the testing of the Buck regulator.

原文English
主出版物標題APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition
頁面1043-1047
頁數5
DOIs
出版狀態Published - 2010 五月 18
事件25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010 - Palm Springs, CA, United States
持續時間: 2010 二月 212010 二月 25

出版系列

名字Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Other

Other25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010
國家United States
城市Palm Springs, CA
期間10-02-2110-02-25

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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  • 引用此

    Huang, J. Y., Wu, C. H., Chang-Chien, L. R., & Chang, S. J. (2010). Oscillation-test technique for buck voltage regulator. 於 APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition (頁 1043-1047). [5433374] (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). https://doi.org/10.1109/APEC.2010.5433374