Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

C. A. Mims; N. I. Joos; P. A.W. Van Der Heide; A. J. Jacobson; C. Chen; C. W. Chu; B. I. Kim; S. S. Perry

doi:10.1149/1.1390958

Oxygen transport in oxide thin film structures. Oriented La_0.5Sr_0.5CoO_3-x on single-crystal yttria-stabilized zirconia

C. A. Mims, N. I. Joos, P. A.W. Van Der Heide, A. J. Jacobson, C. Chen, C. W. Chu, B. I. Kim, S. S. Perry

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25 引文斯高帕斯（Scopus）

摘要

Oriented thin films of La_0.5Sr_0.5CoO_3-x were deposited on single-crystal 9.5 mol% Y₂O₃ stabilized ZrO₂ by laser deposition. The films were infused with ¹⁸O by exchange with 20 kPa O₂ at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

原文	English
頁（從 - 到）	59-61
頁數	3
期刊	Electrochemical and Solid-State Letters
卷	3
發行號	1
DOIs	https://doi.org/10.1149/1.1390958
出版狀態	Published - 2000 1月

All Science Journal Classification (ASJC) codes

化學工程 (全部)
材料科學(全部)
物理與理論化學
電化學
電氣與電子工程

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10.1149/1.1390958

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title = "Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia",

abstract = "Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.",

author = "Mims, {C. A.} and Joos, {N. I.} and {Van Der Heide}, {P. A.W.} and Jacobson, {A. J.} and C. Chen and Chu, {C. W.} and Kim, {B. I.} and Perry, {S. S.}",

year = "2000",

month = jan,

doi = "10.1149/1.1390958",

language = "English",

volume = "3",

pages = "59--61",

journal = "Electrochemical and Solid-State Letters",

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TY - JOUR

T1 - Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

AU - Mims, C. A.

AU - Joos, N. I.

AU - Van Der Heide, P. A.W.

AU - Jacobson, A. J.

AU - Chen, C.

AU - Chu, C. W.

AU - Kim, B. I.

AU - Perry, S. S.

PY - 2000/1

Y1 - 2000/1

N2 - Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

AB - Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

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DO - 10.1149/1.1390958

M3 - Article

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VL - 3

SP - 59

EP - 61

JO - Electrochemical and Solid-State Letters

JF - Electrochemical and Solid-State Letters

SN - 1099-0062

IS - 1

ER -

Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

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All Science Journal Classification (ASJC) codes

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Oxygen transport in oxide thin film structures. Oriented La_0.5Sr_0.5CoO_3-x on single-crystal yttria-stabilized zirconia