Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

C. A. Mims, N. I. Joos, P. A.W. Van Der Heide, A. J. Jacobson, C. Chen, C. W. Chu, B. I. Kim, S. S. Perry

研究成果: Article同行評審

25 引文 斯高帕斯(Scopus)

摘要

Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

原文English
頁(從 - 到)59-61
頁數3
期刊Electrochemical and Solid-State Letters
3
發行號1
DOIs
出版狀態Published - 2000 1月

All Science Journal Classification (ASJC) codes

  • 化學工程 (全部)
  • 材料科學(全部)
  • 物理與理論化學
  • 電化學
  • 電氣與電子工程

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