Particle-in-cell simulation of plasma sheath dynamics with kinetic ions

Chun Wei Huang, Yen Chiao Chen, Yasutaro Nishimura

研究成果: Article

3 引文 (Scopus)

摘要

An electrostatic particle-in-cell simulation code is developed to investigate the interaction between plasma and material surfaces in the presence of secondary electron emission. Kinetic ions are included into the numerical simulation to incorporate the process of ion bombardment on the material surfaces. The influences of the secondary electron emission on sheath dynamics are further investigated, which is induced by ions on top of electrons.

原文English
文章編號7001683
頁(從 - 到)675-682
頁數8
期刊IEEE Transactions on Plasma Science
43
發行號2
DOIs
出版狀態Published - 2015 二月 1

指紋

plasma sheaths
secondary emission
electron emission
kinetics
cells
ions
simulation
sheaths
bombardment
electrostatics
electrons
interactions

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Condensed Matter Physics

引用此文

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Particle-in-cell simulation of plasma sheath dynamics with kinetic ions. / Huang, Chun Wei; Chen, Yen Chiao; Nishimura, Yasutaro.

於: IEEE Transactions on Plasma Science, 卷 43, 編號 2, 7001683, 01.02.2015, p. 675-682.

研究成果: Article

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