Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes

Meng Yen Wu, Meng-Hsueh Chiang

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes」主題。共同形成了獨特的指紋。

Engineering & Materials Science