摘要
Supercritical carbon dioxide (SCCO2) fluids technology is utilized to improve the performance of Zn0.5Mg0.5O deep-ultraviolet (DUV) sensor with metal–semiconductor-metal (MSM) structure in this study. The sensitivity of the device can be enhanced double after SCCO2 fluids treatment. The performance improvement is attributed to the passivation of the interface and the bulk defects resulting from device fabrication process. Based on the material analysis, the oxygen vacancies are reduced after SCCO2 fluids treatment, which demonstrates these defects can be passivated. This study proposes a potential technology for SCCO2 fluids to improve the performance of MSM-type Zn0.5Mg0.5O DUV sensor at low temperatures.
| 原文 | English |
|---|---|
| 文章編號 | 107343 |
| 期刊 | Materials Science in Semiconductor Processing |
| 卷 | 158 |
| DOIs | |
| 出版狀態 | Published - 2023 5月 |
All Science Journal Classification (ASJC) codes
- 一般材料科學
- 凝聚態物理學
- 材料力學
- 機械工業
指紋
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