Perpendicular interface resistance in CoNb xTi 1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6

S. Y. Huang, S. F. Lee, J. C. Huang, G. H. Hwang, Y. D. Yao

研究成果: Article同行評審

摘要

We report here the resistance of Co Nbx Ti1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of CoNbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed.

原文English
文章編號10B103
期刊Journal of Applied Physics
97
發行號10
DOIs
出版狀態Published - 2005 5月 15

All Science Journal Classification (ASJC) codes

  • 物理與天文學 (全部)

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