TY - JOUR
T1 - Perpendicular transport properties of a p-GaAs/δ-doped superlattice/n+-GaAs structure
AU - Liu, W. C.
AU - Sun, C. Y.
AU - Guo, D. F.
AU - Liu, R. C.
PY - 1993
Y1 - 1993
N2 - The perpendicular transport properties of a p-GaAs/δ-doped doped superlattice/n+-GaAs structure were studied at 300 and 77 K. An interesting S-shaped negative differential resistance (NDR), resulting mainly from avalanche multiplications within the superlattice region, was observed at 300 K. A different NDR phenomenon and an interesting hysteresis behavior were found at 77 K. The multistate NDR is attributed to a sequential subavalanche multiplication process occurring within superlattice periods; holes created by avalanche multiplications play an important role in the transport properties. The hysteresis behavior at 77 K seems to be caused by the heavily accumulated holes, which cannot react synchronously with the applied electric field.
AB - The perpendicular transport properties of a p-GaAs/δ-doped doped superlattice/n+-GaAs structure were studied at 300 and 77 K. An interesting S-shaped negative differential resistance (NDR), resulting mainly from avalanche multiplications within the superlattice region, was observed at 300 K. A different NDR phenomenon and an interesting hysteresis behavior were found at 77 K. The multistate NDR is attributed to a sequential subavalanche multiplication process occurring within superlattice periods; holes created by avalanche multiplications play an important role in the transport properties. The hysteresis behavior at 77 K seems to be caused by the heavily accumulated holes, which cannot react synchronously with the applied electric field.
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U2 - 10.1049/ip-g-2.1993.0012
DO - 10.1049/ip-g-2.1993.0012
M3 - Article
AN - SCOPUS:0027585244
SN - 0956-3768
VL - 140
SP - 81
EP - 84
JO - IEE Proceedings, Part G: Circuits, Devices and Systems
JF - IEE Proceedings, Part G: Circuits, Devices and Systems
IS - 2
ER -