In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current-voltage (I-V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.
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