Planning of an Accelerated Degradation Test under Different Constraints of Operating Conditions

I. Chen Lee, Zi Yu Lin

研究成果: Conference contribution

摘要

Accelerated degradation tests (ADTs) are widely used to access the lifetime information of highly reliable products. To obtain the more accurate prediction of lifetime information, how to design an efficient experiment under the limited budget is a critical issue for reliability analysts. Many researchers have addressed this problem and indicated that a two-level design is the optimum strategy for an ADT plan. In addition, most optimum designs were developed under the assumptions that the numbers of measurements and the duration between two inspections within a degradation path are equal for all testing stress levels. Although it is an easier way of operating conditions for experimenters, some real applications showed that the numbers of measurements are different for all stress levels. In this study, based on the Tweedie degradation model, we determine the optimum designs under different operating conditions so that the asymptotic variance of a prediction can be minimized, and compare their performance to the existing strategies.

原文English
主出版物標題2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781728171029
DOIs
出版狀態Published - 2020 八月
事件2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020 - Vancouver, Canada
持續時間: 2020 八月 202020 八月 23

出版系列

名字2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020

Conference

Conference2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
國家/地區Canada
城市Vancouver
期間20-08-2020-08-23

All Science Journal Classification (ASJC) codes

  • 能源工程與電力技術
  • 機械工業
  • 安全、風險、可靠性和品質
  • 建模與模擬

指紋

深入研究「Planning of an Accelerated Degradation Test under Different Constraints of Operating Conditions」主題。共同形成了獨特的指紋。

引用此