Plasma mediated ns-laser erosion of SiC monitored using Raman spectroscopy and in-operando LIBS

Dileep Karnam, Mehdi Rouhani, Jonathan Hobley, Chia Hung Hung, Yu-Lung Lo, Sai Bhavani Sravan Metla, Yeau Ren Jeng

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Engineering & Materials Science

Physics & Astronomy

Chemical Compounds