摘要
The liquid-phase deposition method for growing silicon dioxide interlayers on O2 Ar plasma pretreatment plastic substrates is investigated. The authors found that the ratio of COO (288.9 eV) to C H2 (284.5 eV) increases with the O2 Ar plasma pretreatment as indicated by x-ray photoelectron spectroscopy. Upon treatment, the interlayer on the plastic substrate is grown, and the quality of the film on the substrate with or without plasma pretreatment is examined by using scanning electron microscopy, etching rate of the oxide layer by dilute HF solution, and surface leakage current measurement. Pentacene-based organic thin-film transistors on dielectric layers are demonstrated. Finally, they also found that this coating can enhance optical transmittance, as demonstrated by ultraviolet-visible spectroscopy measurement.
原文 | English |
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頁(從 - 到) | 1635-1639 |
頁數 | 5 |
期刊 | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
卷 | 25 |
發行號 | 5 |
DOIs | |
出版狀態 | Published - 2007 |
All Science Journal Classification (ASJC) codes
- 凝聚態物理學
- 電氣與電子工程