Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator

Ton Ko, Chen Hsing Chao, Pai Sheng Shew, Ching Ting Lee

研究成果: Conference article › 同行評審

原文	English
頁（從 - 到）	120
頁數	1
期刊	Proceedings of SPIE - The International Society for Optical Engineering
卷	1319
DOIs	https://doi.org/10.1117/12.22231
出版狀態	Published - 1990
事件	15th International Optics in Complex Systems 1990 - Garmisch, Germany 持續時間: 1990 8月 5 → …

All Science Journal Classification (ASJC) codes

@article{22351a2462f24ea3a5794984307b7c12,

title = "Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator",

author = "Ton Ko and Chao, {Chen Hsing} and Shew, {Pai Sheng} and Lee, {Ching Ting}",

year = "1990",

doi = "10.1117/12.22231",

language = "English",

volume = "1319",

pages = "120",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

TY - JOUR

T1 - Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator

AU - Ko, Ton

AU - Chao, Chen Hsing

AU - Shew, Pai Sheng

AU - Lee, Ching Ting

PY - 1990

Y1 - 1990

UR - http://www.scopus.com/inward/record.url?scp=0025623830&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025623830&partnerID=8YFLogxK

U2 - 10.1117/12.22231

DO - 10.1117/12.22231

M3 - Conference article

AN - SCOPUS:0025623830

SN - 0277-786X

VL - 1319

SP - 120

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 15th International Optics in Complex Systems 1990

Y2 - 5 August 1990

ER -