TY - GEN
T1 - Processor shield for L1 data cache software-based on-line self-testing
AU - Lin, Ching Wen
AU - Chen, Chung Ho
N1 - Publisher Copyright:
© 2017 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/2/16
Y1 - 2017/2/16
N2 - Conventional software-based cache self-tests typically ignore system related testing issues, such as physical memory layout, virtual memory mapping, and isolating faulty effects, especially for on-line testing. We propose an architectural support for data cache solware-based self-testing (SBST): Processor Shield, which can tackle difflcult-to-test issues during on-line SBST. The proposed processor shield includes a software framework and design for testing (DFT) hardware, which enables SBST program to run without influencing other processes and on-bus devices even if a cache test fails. The proposed SBST process can be iteratively executed and cooperate with dynamic voltage frequency scaling (DVFS) system to calibrate the required guardbands to accommodate transistor aging effects. Finally, we present a case study that performs SBST programs under Linux kernel on an ARMv5-compatible processor system. Our method can successfully switch between the SBST process and the kernel process and achieve the expected high fault coverages for cache control logic and RAM module testing.
AB - Conventional software-based cache self-tests typically ignore system related testing issues, such as physical memory layout, virtual memory mapping, and isolating faulty effects, especially for on-line testing. We propose an architectural support for data cache solware-based self-testing (SBST): Processor Shield, which can tackle difflcult-to-test issues during on-line SBST. The proposed processor shield includes a software framework and design for testing (DFT) hardware, which enables SBST program to run without influencing other processes and on-bus devices even if a cache test fails. The proposed SBST process can be iteratively executed and cooperate with dynamic voltage frequency scaling (DVFS) system to calibrate the required guardbands to accommodate transistor aging effects. Finally, we present a case study that performs SBST programs under Linux kernel on an ARMv5-compatible processor system. Our method can successfully switch between the SBST process and the kernel process and achieve the expected high fault coverages for cache control logic and RAM module testing.
UR - http://www.scopus.com/inward/record.url?scp=85015344729&partnerID=8YFLogxK
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U2 - 10.1109/ASPDAC.2017.7858359
DO - 10.1109/ASPDAC.2017.7858359
M3 - Conference contribution
AN - SCOPUS:85015344729
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 420
EP - 425
BT - 2017 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017
Y2 - 16 January 2017 through 19 January 2017
ER -