Processor shield for L1 data cache software-based on-line self-testing

Ching Wen Lin, Chung Ho Chen

研究成果: Conference contribution

3 引文 斯高帕斯(Scopus)

摘要

Conventional software-based cache self-tests typically ignore system related testing issues, such as physical memory layout, virtual memory mapping, and isolating faulty effects, especially for on-line testing. We propose an architectural support for data cache solware-based self-testing (SBST): Processor Shield, which can tackle difflcult-to-test issues during on-line SBST. The proposed processor shield includes a software framework and design for testing (DFT) hardware, which enables SBST program to run without influencing other processes and on-bus devices even if a cache test fails. The proposed SBST process can be iteratively executed and cooperate with dynamic voltage frequency scaling (DVFS) system to calibrate the required guardbands to accommodate transistor aging effects. Finally, we present a case study that performs SBST programs under Linux kernel on an ARMv5-compatible processor system. Our method can successfully switch between the SBST process and the kernel process and achieve the expected high fault coverages for cache control logic and RAM module testing.

原文English
主出版物標題2017 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面420-425
頁數6
ISBN(電子)9781509015580
DOIs
出版狀態Published - 2017 2月 16
事件22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017 - Chiba, Japan
持續時間: 2017 1月 162017 1月 19

出版系列

名字Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017
國家/地區Japan
城市Chiba
期間17-01-1617-01-19

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程
  • 電腦科學應用
  • 電腦繪圖與電腦輔助設計

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