Quality, Reliability and Statistics in Nano-Technology

J.-C. Lu, Shuen-Lin Jeng, S. C. Lin, Ni Wang, M. K. Jeong

研究成果: Conference contribution

原文	English
主出版物標題	The International Federation of Operational Research Societies
出版地	Honolulu, Hawaii
出版狀態	Published - 2005 7月 11

引用此

@inproceedings{758bcb5a5feb4b3082730500bce83c44,

title = "Quality, Reliability and Statistics in Nano-Technology",

author = "J.-C. Lu and Shuen-Lin Jeng and Lin, {S. C.} and Ni Wang and Jeong, {M. K.}",

year = "2005",

month = jul,

day = "11",

language = "English",

booktitle = "The International Federation of Operational Research Societies",

}