RAMSES-D: DRAM fault simulator supporting weighted coupling fault

Yu Tsao Hsing, Song Guang Wu, Cheng Wen Wu

研究成果: Conference contribution

7 引文 斯高帕斯(Scopus)

摘要

Memory fault simulator is an important tool for memory test sequence optimization. Traditionally, we use fault count to calculate fault coverage. However, it cannot represent accurately the real coupling fault distribution. In this paper, we adopt the concept of weighted coupling fault targeting DRAM.We propose a weighted fault coverage function with assigning weight parameters to coupling faults. With the weighted function, we can use physical information to calculate coupling fault coverage. Experimental result shows that the weight of intra-word coupling fault can be 10% to 14%; while the original fault count method cannot distinguish the degree of importance between different memory configurations.

原文English
主出版物標題17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
頁面33-38
頁數6
DOIs
出版狀態Published - 2007 十二月 1
事件17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan
持續時間: 2007 十二月 32007 十二月 5

出版系列

名字Records of the IEEE International Workshop on Memory Technology, Design and Testing
ISSN(列印)1087-4852

Conference

Conference17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
國家/地區Taiwan
城市Taipei
期間07-12-0307-12-05

All Science Journal Classification (ASJC) codes

  • 媒體技術

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