TY - JOUR
T1 - Random Lasing Emission of ZnO Nanorods from Different Seeding Thickness
AU - Rosli, Nurizati
AU - Halim, Mohd Mahadi
AU - Kamil, Wan Maryam Wan Ahmad
AU - Hashim, Md Roslan
AU - Hsu, Hsu Cheng
AU - Zhuang, Jia Yuan
AU - Siyuan, Chan
N1 - Funding Information:
This work is supported by FRGS grant with Project Code: FRGS/1/2020/STG07/USM/02/10 under Ministry of Higher Education Malaysia, the Ministry of Science and Technology of Taiwan (MOST 109-2112-M-006-016), and 2020 SATU Joint Research Scheme (JRS) NCKU 16. Extended thanks to the staff of Nano-Optoelectronics Research and Technology Lab, School of Physics, Universiti Sains Malaysia.
Publisher Copyright:
© Published under licence by IOP Publishing Ltd.
PY - 2022
Y1 - 2022
N2 - We present the growth of ZnO nanorods (NRods) prepared by chemical bath deposition on 100 nm and 200 nm ZnO seed layer sputtered on glass substrate. The structural and optical properties of ZnO NRods were investigated by Field Emission Scanning Electron Microscope (FESEM), energy-dispersive X-ray (EDX), X-Ray Diffraction (XRD), and UV-Visible (UV-Vis) analyses. Random lasing (RL) emission behaviour was characterized by pulsed-wave micro-photoluminescence (pw μ-PL) analysis. Changed in seed layer thickness on 100 nm and 200 nm, allowing for greater particle size of ZnO NRods to form, while maintaining the preferred diffraction of self-organized growth direction with high-quality c-plane. The reduction in optical properties of ZnO NRods also lowering random lasing emission threshold toward higher excitation power density from 37.86 kW/cm2 to 95.40 kW/cm2.
AB - We present the growth of ZnO nanorods (NRods) prepared by chemical bath deposition on 100 nm and 200 nm ZnO seed layer sputtered on glass substrate. The structural and optical properties of ZnO NRods were investigated by Field Emission Scanning Electron Microscope (FESEM), energy-dispersive X-ray (EDX), X-Ray Diffraction (XRD), and UV-Visible (UV-Vis) analyses. Random lasing (RL) emission behaviour was characterized by pulsed-wave micro-photoluminescence (pw μ-PL) analysis. Changed in seed layer thickness on 100 nm and 200 nm, allowing for greater particle size of ZnO NRods to form, while maintaining the preferred diffraction of self-organized growth direction with high-quality c-plane. The reduction in optical properties of ZnO NRods also lowering random lasing emission threshold toward higher excitation power density from 37.86 kW/cm2 to 95.40 kW/cm2.
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U2 - 10.1088/1742-6596/2411/1/012018
DO - 10.1088/1742-6596/2411/1/012018
M3 - Conference article
AN - SCOPUS:85146577612
SN - 1742-6588
VL - 2411
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012018
T2 - 5th Photonics Meeting 2022, PM 2022
Y2 - 19 September 2022 through 20 September 2022
ER -