TY - JOUR
T1 - Rapid growth of Nd2-xCexCuO4 thick films as a buffer for the growth of rare-earth barium cuprate-coated conductors
AU - Qi, Xiaoding
AU - Soorie, Masood
AU - Lockman, Zainovia
AU - MacManus-Driscoll, Judith L.
N1 - Funding Information:
We are indebted to Engineering and Physical Sciences Research (EPSRC) of the United Kingdom for funding this work. Dr. W. Goldacker and Dr. R. Nast of Karls-ruhe Forschungszentrum are acknowledged for provision of the (200)Ni foils. We would like to thank Prof. Don McK Paul and Dr. Geetha Balakrishana at Warwick University for providing crystal growth facilities for the development of a novel horizontal LPE process.
PY - 2002/1
Y1 - 2002/1
N2 - Nd2-xCexCuO4 (x = 0 to 0.15) thick films were grown directly on LaAlO3 substrates and surface-oxidized Ni tapes by fast liquid-phase processing methods. The films had a smooth surface and a very good biaxial texture, with the full width at half-maximum equal to 0.8° and 5° on LaAlO3 substrates and surface-oxidized Ni tapes, respectively. Films of thickness of 5-15 μm were grown at rates in excess of 2 μm/min. Nd2-xCexCuO4 has a good lattice and thermal-expansion match to rare-earth Ba2Cu3O7-δ (REBCO), minimum reaction with the high-temperature CuO:BaO solutions, and is nonpoisoning to superconductivity. It is an ideal buffer for liquid-phase expitaxy processing of REBCO thick films.
AB - Nd2-xCexCuO4 (x = 0 to 0.15) thick films were grown directly on LaAlO3 substrates and surface-oxidized Ni tapes by fast liquid-phase processing methods. The films had a smooth surface and a very good biaxial texture, with the full width at half-maximum equal to 0.8° and 5° on LaAlO3 substrates and surface-oxidized Ni tapes, respectively. Films of thickness of 5-15 μm were grown at rates in excess of 2 μm/min. Nd2-xCexCuO4 has a good lattice and thermal-expansion match to rare-earth Ba2Cu3O7-δ (REBCO), minimum reaction with the high-temperature CuO:BaO solutions, and is nonpoisoning to superconductivity. It is an ideal buffer for liquid-phase expitaxy processing of REBCO thick films.
UR - http://www.scopus.com/inward/record.url?scp=0036259075&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0036259075&partnerID=8YFLogxK
U2 - 10.1557/JMR.2002.0001
DO - 10.1557/JMR.2002.0001
M3 - Article
AN - SCOPUS:0036259075
SN - 0884-2914
VL - 17
SP - 1
EP - 4
JO - Journal of Materials Research
JF - Journal of Materials Research
IS - 1
ER -