Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman; Cheng Wen Wu

doi:10.1109/MTDT.2005.23

Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman
, Cheng Wen Wu

電機工程學系

研究成果: Editorial › 同行評審

原文	English
頁（從 - 到）	8
頁數	1
期刊	Records of the IEEE International Workshop on Memory Technology, Design and Testing
DOIs	https://doi.org/10.1109/MTDT.2005.23
出版狀態	Published - 2005 12月 9
事件	Proceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005 - Taipei, Taiwan 持續時間: 2005 8月 3 → 2005 8月 5

All Science Journal Classification (ASJC) codes

媒體技術

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10.1109/MTDT.2005.23

其它文件與鏈接

引用此

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title = "Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword",

author = "Rochit Rajsuman and Wu, \{Cheng Wen\}",

year = "2005",

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journal = "Records of the IEEE International Workshop on Memory Technology, Design and Testing",

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Y2 - 3 August 2005 through 5 August 2005

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