Reduced current thresholds in GaAs/AlGaAs vertical cavity surface emitting lasers using 4° off-oriented (001) GaAs substrates

Y. H. Wang, K. Tai, Y. F. Hsieh, S. N.G. Chu, J. D. Wynn, M. Hong, R. J. Fischer, A. Y. Cho

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2 引文 斯高帕斯(Scopus)

摘要

GaAs/AlGaAs vertical cavity surface emitting lasers (VCSELs) with two semiconductor distributed Bragg reflectors (DBRs) were grown by molecular beam epitaxy. The threshold current was found to be 20-50% less on an average for the bulk VCSELs with an active layer of 0.47 μm thick grown on the 4° off-orientation (001) substrates than those on the on-orientation ones. The lower threshold current was attributed to the smoother interfaces of the Al0.1Ga0.9As/AlAs DBRs in the off-orientation growth observed by transmission electron microscopy.

原文English
頁(從 - 到)1057-1061
頁數5
期刊Journal of Crystal Growth
111
發行號1-4
DOIs
出版狀態Published - 1991 5月 2

All Science Journal Classification (ASJC) codes

  • 凝聚態物理學
  • 無機化學
  • 材料化學

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