Reliability issues on the novel surface acoustic wave notch filter

Han Jan Chen, I. Tseng Tang, Mau Phon Houng, Yeong Her Wang

研究成果: Conference contribution

摘要

A novel surface acoustic wave (SAW) notch filter was fabricated on 128°-rotated YX-cut lithium niobate (LiNbO3) with a finger width of 8 μm. Then, photolithography and lift-off techniques were applied to make a metal pattern on the LiNbO3 substrates. Finally, a central frequency of 113.4 MHz, and a 3 dB bandwidth of 0.36 % and the insertion loss S21 of -10.583 dB are obtained. The novel SAW notch filter is a planar filter that has a small volume. It is also a passive device that has no power consumption. The frequency response curve of the novel SAWnotch filters is sharper than RLC notch devices. Another advantage of novel SAW notch filters in communication systems is a sufficient high-power durability. With different electrode materials, this will allow power levels up to 30 dBm. It shows that the novel SAW notch filers have a higher reliability than RLC notch filters with high-power AC input signals. Combining high stability, high stop-band rejection and narrow transition width from pass-band to the stop-band, the novel surface acoustic wave notch filters offer superior performance over other notch devices.

原文English
主出版物標題Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002
發行者Institute of Electrical and Electronics Engineers Inc.
頁面106-111
頁數6
ISBN(電子)078037682X, 9780780376823
DOIs
出版狀態Published - 2002 一月 1
事件4th International Symposium on Electronic Materials and Packaging, EMAP 2002 - Kaohsiung, Taiwan
持續時間: 2002 十二月 42002 十二月 6

出版系列

名字Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002

Other

Other4th International Symposium on Electronic Materials and Packaging, EMAP 2002
國家Taiwan
城市Kaohsiung
期間02-12-0402-12-06

指紋

Notch filters
Surface waves
Acoustic waves
Wave filters
Photolithography
Insertion losses
Frequency response
Communication systems
Durability
Lithium
Electric power utilization
Metals
Bandwidth
Electrodes
Substrates
lithium niobate

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Materials Science(all)

引用此文

Chen, H. J., Tang, I. T., Houng, M. P., & Wang, Y. H. (2002). Reliability issues on the novel surface acoustic wave notch filter. 於 Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002 (頁 106-111). [1188821] (Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMAP.2002.1188821
Chen, Han Jan ; Tang, I. Tseng ; Houng, Mau Phon ; Wang, Yeong Her. / Reliability issues on the novel surface acoustic wave notch filter. Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002. Institute of Electrical and Electronics Engineers Inc., 2002. 頁 106-111 (Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002).
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abstract = "A novel surface acoustic wave (SAW) notch filter was fabricated on 128°-rotated YX-cut lithium niobate (LiNbO3) with a finger width of 8 μm. Then, photolithography and lift-off techniques were applied to make a metal pattern on the LiNbO3 substrates. Finally, a central frequency of 113.4 MHz, and a 3 dB bandwidth of 0.36 {\%} and the insertion loss S21 of -10.583 dB are obtained. The novel SAW notch filter is a planar filter that has a small volume. It is also a passive device that has no power consumption. The frequency response curve of the novel SAWnotch filters is sharper than RLC notch devices. Another advantage of novel SAW notch filters in communication systems is a sufficient high-power durability. With different electrode materials, this will allow power levels up to 30 dBm. It shows that the novel SAW notch filers have a higher reliability than RLC notch filters with high-power AC input signals. Combining high stability, high stop-band rejection and narrow transition width from pass-band to the stop-band, the novel surface acoustic wave notch filters offer superior performance over other notch devices.",
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Chen, HJ, Tang, IT, Houng, MP & Wang, YH 2002, Reliability issues on the novel surface acoustic wave notch filter. 於 Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002., 1188821, Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002, Institute of Electrical and Electronics Engineers Inc., 頁 106-111, 4th International Symposium on Electronic Materials and Packaging, EMAP 2002, Kaohsiung, Taiwan, 02-12-04. https://doi.org/10.1109/EMAP.2002.1188821

Reliability issues on the novel surface acoustic wave notch filter. / Chen, Han Jan; Tang, I. Tseng; Houng, Mau Phon; Wang, Yeong Her.

Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 106-111 1188821 (Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002).

研究成果: Conference contribution

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Chen HJ, Tang IT, Houng MP, Wang YH. Reliability issues on the novel surface acoustic wave notch filter. 於 Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 106-111. 1188821. (Proceedings of the 4th International Symposium on Electronic Materials and Packaging, EMAP 2002). https://doi.org/10.1109/EMAP.2002.1188821