Reliability measures for Hebbian-type associative memories with faulty interconnections

Pau-Choo Chung, Thomas F. Krile

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

The performance of Hebbian-type associative memories (HAMs) in the presence of faulty interconnections is examined, and equations for predicting network reliability are developed. Several HAM operating modes, i.e., zero or nonzero autoconnections (ZA or NZA), bipolar or unipolar network inputs, asynchronous or synchronous operation, have been investigated. Networks with NZA and bipolar inputs have the best performance in both capacity and reliability. Based on this type of network, an equation relating the probability of direct one-step convergence, Pdc, to the percentage of failed connections is derived. For a connection failure rate of up to 50%, this equation can estimate Pdc accurately. The results of the authors' theoretical investigation show that reliability becomes poorer when the network size increases; hence, reducing the percentage of failed connections becomes very important in physical implementations of large networks. Also, as the number of stored vectors increases, the network reliability decreases. Simulation results indicate that asynchronous-mode and synchronous-mode operation have the same Pdc and reliability when there are no error bits in the probe vector, but networks operating in the asynchronous mode have higher Pdc and better reliability when the number of input errors increases. Reliability measures for second-order HAMs are also investigated.

原文English
主出版物標題90 Int Jt Conf Neural Networks IJCNN 90
發行者Publ by IEEE
頁面847-852
頁數6
出版狀態Published - 1990
事件1990 International Joint Conference on Neural Networks - IJCNN 90 - San Diego, CA, USA
持續時間: 1990 六月 171990 六月 21

Other

Other1990 International Joint Conference on Neural Networks - IJCNN 90
城市San Diego, CA, USA
期間90-06-1790-06-21

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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