Reliability mechanisms of LTPS-TFT with HfO2 gate dielectric: PBTI, NBTI, and hot-carrier stress

Ming Wen Ma, Chi Yang Chen, Woei Cheng Wu, Chun Jung Su, Kuo Hsing Kao, Tien Sheng Chao, Tan Fu Lei

研究成果: Article同行評審

42 引文 斯高帕斯(Scopus)

指紋

深入研究「Reliability mechanisms of LTPS-TFT with HfO2 gate dielectric: PBTI, NBTI, and hot-carrier stress」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds