Reliability prediction of imperfect switching systems under Gamma distribution

J. N. Pan, S. W. Sun

研究成果: Article同行評審

摘要

Reliability Prediction plays a very important role in system design, and the two key factors considered in predicting system reliability are: failure distribution of the component/equipment and system configuration. This paper conducts reliability estimation and comparison on different imperfect systems with components, switch and sensor under different failure rate and various intended periods of use. The results can provide guidelines of decision making for system design in industries.

原文English
頁(從 - 到)169-180
頁數12
期刊Kung Yeh Kung Chieng Hsueh K'an/Journal of the Chinese Institute of Industrial Engineers
14
發行號2
DOIs
出版狀態Published - 1997 1月 1

All Science Journal Classification (ASJC) codes

  • 工業與製造工程

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