Repairable Cell-Based Chip Design for Simultaneous Yield Enhancement and Fault Diagnosis

Sheng Lin Lin, Cheng Hung Wu, Kuen Jong Lee

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

Fault diagnosis plays a major role in IC yield enhancement. Due to circuit structure and ATPG limitation, there exist many undistinguished fault pairs after applying test patterns and diagnosis patterns, including equivalent fault pairs and aborted fault pairs. This paper proposes a scan-based repair-for-diagnosis architecture that can distinguish undistinguished fault pairs by repairing cell defects. A repairable standard cell design technique is presented that makes the repair of defective cells easy to control. To efficiently distinguish all targeted undistinguished fault pairs, a novel fault-grouping method is developed and applied to the proposed scan-based repair-for-diagnosis architecture. With this architecture, one can distinguish multiple fault pairs and repair those defective cells hence improving yield at the same time. Experimental results show that our proposed architecture can distinguish all targeted undistinguished fault pairs and repair the defective cells with low area overhead.

原文English
主出版物標題Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016
發行者IEEE Computer Society
頁面25-30
頁數6
ISBN(電子)9781509038084
DOIs
出版狀態Published - 2016 十二月 22
事件25th IEEE Asian Test Symposium, ATS 2016 - Hiroshima, Japan
持續時間: 2016 十一月 212016 十一月 24

出版系列

名字Proceedings of the Asian Test Symposium
ISSN(列印)1081-7735

Other

Other25th IEEE Asian Test Symposium, ATS 2016
國家Japan
城市Hiroshima
期間16-11-2116-11-24

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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