Retention Leveling: Leverage Retention Refreshing and Wear Leveling Techniques to Enhance Flash Reliability with the Awareness of Temperature

Wei Chen Wang, Chien Chung Ho, Yuan Hao Chang, Tei Wei Kuo, Yu Ming Chang

研究成果: Conference contribution

摘要

Wear leveling cannot entirely mitigate retention errors, which have recently become $a$ substantial reliability issue due to cell shrinking. This paper focuses on preserving accurate data by addressing retention errors rather than uniformly distributing erases across blocks, as maintaining accurate data is the true goal for enhancing reliability. We propose the concept of retention leveling, considering $a$ crucial factor, i.e., temperature, and compare it to traditional wear leveling. Experimental results demonstrate that retention leveling can significantly improve flash memory reliability by limiting the number of retention errors to merely 0.0019% of the conventional approach, while substantially alleviating the write amplification problem.

原文English
主出版物標題Proceedings - 2023 12th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2023
發行者Institute of Electrical and Electronics Engineers Inc.
頁面7-12
頁數6
ISBN(電子)9798350344967
DOIs
出版狀態Published - 2023
事件12th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2023 - Niigata, Japan
持續時間: 2023 8月 302023 9月 1

出版系列

名字Proceedings - 2023 12th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2023

Conference

Conference12th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2023
國家/地區Japan
城市Niigata
期間23-08-3023-09-01

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 電腦科學應用
  • 硬體和架構
  • 電氣與電子工程
  • 安全、風險、可靠性和品質

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