Revealing anisotropic strain in exfoliated graphene by polarized Raman spectroscopy

Cheng Wen Huang, Ren Jye Shiue, Hsiang Chen Chui, Wei Hua Wang, Juen Kai Wang, Yonhua Tzeng, Chih Yi Liu

研究成果: Article同行評審

15 引文 斯高帕斯(Scopus)

摘要

We report on a polarized Raman study on mechanically cleaved single-layer graphene films. Under a specific orientation of scattering measurement, the width and position of the G peak change with the incident polarization direction, while the integrated intensity of that is unaltered. This phenomenon is explained by a proposed mode in which the peak is contributed by a mixture of un-, compressive-, and tensile-strained G sub-modes. The compression and tension are both uniaxial and approximately perpendicular to each other. They are undesigned and located in either separated or overlapped sub-areas within the probed local region. Compared to the unstrained wavenumber of 1580 cm -1, compression induces a blue shift while tension causes a red one. The sub-modes correlated with the light polarization through different relationships split the G peak into three sub-ones. We develop a method to quantitatively analyze the positions, widths, intensities, and polarization dependences of sub-peaks. This analysis quantitatively reveals local strain, which changes with the detected area of a graphene film. The method presented here can be extended to detect the strain distribution in the film and thus is a promising technology for graphene characterization.

原文English
頁(從 - 到)9626-9632
頁數7
期刊Nanoscale
5
發行號20
DOIs
出版狀態Published - 2013 十月 21

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

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